M.-P. Besland: search on Z-Library

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1

Surface evolution of sputtered Cu(In,Ga)Se2thin films under various annealing temperatures

Han, Jun-feng, Ouyang, Liang-qi, Zhuang, Da-ming, Zhao, Ming, Liao, Cheng, Liu, Jiang, Cha, Limei, Besland, M.-P.

Journal:

Journal of Materials Science: Materials in Electronics

Year:

2015

Language:

english

File:

PDF, 1.15 MB

english, 2015

2

Small scale mechanical properties of polycrystalline materials: in situ diffraction studies

Girault, B., Vidal, V., Thilly, L., Renault, P O., Goudeau, P., Bourhis, E. Le, Valat, P. Villain, Geandier, G., Tranchant, J., Landesman, J P., Tessier, P Y., Angleraud, B., Besland, M P., Djouadi, A

Journal:

International Journal of Nanotechnology

Year:

2008

Language:

english

File:

PDF, 1.24 MB

english, 2008

3

Competition between V2O3 phases deposited by one-step reactive sputtering process on polycrystalline conducting electrode

Rupp, J.A.J., Janod, E., Besland, M.-P., Corraze, B., KindsmÃ¼ller, A., QuerrÃ©, M., Tranchant, J., Cario, L., Dittmann, R., Waser, R., Wouters, D.J.

Journal:

Thin Solid Films

Year:

2020

File:

PDF, 2.20 MB

2020

4

Investigation of BST thin films deposited by RF magnetron sputtering in pure Argon

F. Challali, M.P. Besland, D. Benzeggouta, C. Borderon, M.C. Hugon, S. Salimy, J.C. Saubat, A. Charpentier, D. Averty, A. Goullet, J.P. Landesman

Journal:

Thin Solid Films

Year:

2010

Language:

english

File:

PDF, 519 KB

english, 2010

5

TWO STEP REACTIVE MAGNETRON SPUTTERING OF BLT THIN FILMS

BESLAND, M. P., BORDERON, C., CAVELLIER, M., LE TACON, S., RICHARD-PLOUET, M., ALBERTINI, D., AVERTY, D., TESSIER, P. Y., GUNDEL, H. W., BROHAN, L., DJOUADI, M. A.

Journal:

Integrated Ferroelectrics

Year:

2007

Language:

english

File:

PDF, 2.86 MB

english, 2007

6

Electrical characterizations of resistive random access memory devices based on GaV4S8 thin layers

Tranchant, J., Janod, E., Cario, L., Corraze, B., Souchier, E., Leclercq, J.-L., Cremillieu, P., Moreau, P., Besland, M.-P.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.26 MB

english, 2013

7

An optimized In–CuGa metallic precursors for chalcopyrite thin films

Han, Jun-feng, Liao, Cheng, Jiang, Tao, Xie, Hua-mu, Zhao, Kui, Besland, M.–P.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.62 MB

english, 2013

8

Studies of CdS/CdTe interface: Comparison of CdS films deposited by close space sublimation and chemical bath deposition techniques

Han, Jun-feng, Fu, Gan-hua, Krishnakumar, V., Schimper, Hermann-Josef, Liao, Cheng, Jaegermann, Wolfram, Besland, M.P.

Journal:

Thin Solid Films

Year:

2015

Language:

english

File:

PDF, 721 KB

english, 2015

9

Investigation of chalcopyrite film growth at various temperatures: analyses from top to the bottom of the thin films

J. Han, C. Liao, T. Jiang, H. Xie, K. Zhao, M. Besland

Journal:

Journal of Materials Science: Materials in Electronics

Year:

2014

Language:

english

File:

PDF, 2.55 MB

english, 2014

10

Resistive Switching in Mott Insulators and Correlated Systems

Janod, Etienne, Tranchant, Julien, Corraze, Benoit, Querré, Madec, Stoliar, Pablo, Rozenberg, Marcelo, Cren, Tristan, Roditchev, Dimitri, Phuoc, Vinh Ta, Besland, Marie-Paule, Cario, Laurent

Journal:

Advanced Functional Materials

Year:

2015

Language:

english

File:

PDF, 4.65 MB

english, 2015

11

Deposition by radio frequency magnetron sputtering of GaV4S8 thin films for resistive random access memory application

Souchier, E., Besland, M.-P., Tranchant, J., Corraze, B., Moreau, P., Retoux, R., Estournès, C., Mazoyer, P., Cario, L., Janod, E.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 907 KB

english, 2013

12

TiO2-SiO2 mixed oxide deposited by low pressure PECVD: Insights on optical and nanoscale electrical properties

Mitronika, M., Villeneuve-Faure, C., Massol, F., Boudou, L., Ravisy, W., Besland, M.P., Goullet, A., Richard-Plouet, M.

Journal:

Applied Surface Science

Year:

2021

File:

PDF, 6.05 MB

2021

13

Structural and dielectric characterization of sputtered Tantalum Titanium Oxide thin films for high temperature capacitor applications

Rouahi, A., Challali, F., Dakhlaoui, I., Vallée, C., Salimy, S., Jomni, F., Yangui, B., Besland, M.P., Goullet, A., Sylvestre, A.

Journal:

Thin Solid Films

Year:

2016

Language:

english

File:

PDF, 2.70 MB

english, 2016

14

Growth of passivating UV/ozone oxides on InP: Correlations between chemical composition and interfacial electrical properties

M.-P. Besland, P. Louis, Y. Robach, J. Joseph, G. Hollinger, D. Gallet, P. Viktorovitch

Journal:

Applied Surface Science

Year:

1992

Language:

english

File:

PDF, 502 KB

english, 1992

15

In Situ Studies of the Anodic Oxidation of Indium Phosphide

Journal:

Journal of The Electrochemical Society

Year:

1993

Language:

english

File:

PDF, 561 KB

english, 1993

16

[IEEE International Conference on Indium Phosphide and Related Materials - Santa Barbara, CA, USA (12-16 May 2003)] International Conference onIndium Phosphide and Related Materials, 2003. - High quality epitaxial growth on new InP/Si substrate

Kostrzewa, M., Regreny, P., Besland, M.P., Leclercq, J.L., Grenet, G., Rojo-Romeo, P., Jalaguier, E., Perreau, P., Moriceau, H., Marty, O., Hollinger, G.

Year:

2003

Language:

english

File:

PDF, 422 KB

english, 2003

17

Low temperature plasma carbon nanotubes growth on patterned catalyst

M. Dubosc, T. Minea, M.P. Besland, C. Cardinaud, A. Granier, A. Gohier, S. Point, J. Torres

Journal:

Microelectronic Engineering

Year:

2006

Language:

english

File:

PDF, 570 KB

english, 2006

18

First evidence of resistive switching in polycrystalline GaV4S8 thin layers

Emeline Souchier, Laurent Cario, Benoit Corraze, Philippe Moreau, Pascale Mazoyer, Claude Estournès, Richard Retoux, Etienne Janod, Marie-Paule Besland

Journal:

physica status solidi (RRL) - Rapid Research Letters

Year:

2011

Language:

english

File:

PDF, 200 KB

english, 2011

19

Interpretation of stress variation in silicon nitride films deposited by electron cyclotron resonance plasma

Besland, M. P., Lapeyrade, M., Delmotte, F., Hollinger, G.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2004

Language:

english

File:

PDF, 708 KB

english, 2004

20

[IEEE 1993 (5th) International Conference on Indium Phosphide and Related Materials - Paris, France (19-22 April 1993)] 1993 (5th) International Conference on Indium Phosphide and Related Materials - Evaluation of InP Epi-ready wafers for epitaxial growth

Overs, A., Jacob, G., Besland, M.P., Drouot, V., Gendry, M., Hollinger, G., Gauneau, M., Lecrosnier, D., Benchimol, J.L.

Year:

1993

Language:

english

File:

PDF, 267 KB

english, 1993

21

Mott-memories Based on the Narrow Gap Mott Insulators AM4Q8 (A=Ga, Ge ; M = V, Nb, Ta ; Q = S, Se)

Cario, L., Janod, E., Tranchant, J., Stoliar, P., Rozenberg, M., Besland, M.-P., Corraze, B.

Journal:

MRS Proceedings

Year:

2013

Language:

english

File:

PDF, 772 KB

english, 2013

22

Characterizations of CNx thin films made by ionized physical vapor deposition

F. Tétard, P. Djemia, M.P. Besland, P.Y. Tessier, B. Angleraud

Journal:

Thin Solid Films

Year:

2005

Language:

english

File:

PDF, 320 KB

english, 2005

23

[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Passive components integration in CMOS technology

Salimy, S., Toutain, S., Averty, D., Challali, F., Goullet, A., Besland, M-P, Rhallabi, A., Landesman, J-P., Saubat, J-C, Charpentier, A.

Year:

2010

Language:

english

File:

PDF, 867 KB

english, 2010

24

Impact of magnetron configuration on plasma and film properties of sputtered aluminum nitride thin films

C. Duquenne, P. Y. Tessier, M. P. Besland, B. Angleraud, P. Y. Jouan, R. Aubry, S. Delage, M. A. Djouadi

Year:

2008

Language:

english

File:

PDF, 1.06 MB

english, 2008

25

Electric Pulse Induced Resistive Switching in the Narrow Gap Mott Insulator GaMo4S8

Querré, Madec, Corraze, Benoit, Janod, Etienne, Besland, Marie Paule, Tranchant, Julien, Potel, Michel, Cordier, Stephane, Bouquet, Valérie, Guilloux-Viry, Maryline, Cario, Laurent

Journal:

Key Engineering Materials

Year:

2014

Language:

english

File:

PDF, 563 KB

english, 2014

26

TEM and XPS studies on CdS/CIGS interfaces

Han, Jun-feng, Liao, Cheng, Cha, Li-mei, Jiang, Tao, Xie, Hua-mu, Zhao, Kui, Besland, M.-P.

Journal:

Journal of Physics and Chemistry of Solids

Year:

2014

Language:

english

File:

PDF, 1.38 MB

english, 2014

27

Passivation of InP using In(PO3)3-condensed phosphates: From oxide growth properties to metal-insulator-semiconductor field-effect-transistor devices

Y. Robach, M. P. Besland, J. Joseph, G. Hollinger, P. Viktorovitch, P. Ferret, M. Pitaval, A. Falcou, G. Post

Year:

1992

Language:

english

File:

PDF, 1.82 MB

english, 1992

28

[IEEE 2017 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2017.5.14-2017.5.17)] 2017 IEEE International Memory Workshop (IMW) - An Artificial Neuron Founded on Resistive Switching of Mott Insulators

Adda, Coline, Tranchant, Julien, Stoliar, Pablo, Corraze, Benoit, Janod, Etienne, Gay, Ralph, Llopis, Roger, Besland, Marie-Paule, Hueso, Luis E., Cario, Laurent

Year:

2017

Language:

english

File:

PDF, 594 KB

english, 2017

29

Electrical characterization of metal-oxide-InP tunnel diodes based on current-voltage, admittance and low frequency noise measurements

P Viktorovitch, P Louis, M.P Besland, A Chovet

Journal:

Solid-State Electronics

Year:

1995

Language:

english

File:

PDF, 1005 KB

english, 1995

30

Thermal conductivity of aluminium nitride thin films prepared by reactive magnetron sputtering

Duquenne, C, Besland, M-P, Tessier, P Y, Gautron, E, Scudeller, Y, Averty, D

Journal:

Journal of Physics D Applied Physics

Year:

2012

Language:

english

File:

PDF, 1.09 MB

english, 2012

31

Adapted wavelength methods for in situ ellipsometry

S. Callard, A. Gagnaire, M.P. Besland, J. Joseph

Journal:

Thin Solid Films

Year:

1998

Language:

english

File:

PDF, 190 KB

english, 1998

32

Dielectric relaxation study of amorphous TiTaO thin films in a large operating temperature range

Rouahi, A., Kahouli, A., Challali, F., Besland, M. P., Vallée, C., Pairis, S., Yangui, B., Salimy, S., Goullet, A., Sylvestre, A.

Journal:

Journal of Applied Physics

Year:

2012

Language:

english

File:

PDF, 1.02 MB

english, 2012

33

[IEEE Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM - Nara, Japan (14-18 May 2001)] Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198) - Correlated and anti-correlated vertical self-organization of InAs quantum wires in InAs/InP stacked structures versus the spacer layer nature

Gendry, M., Brault, J., Monat, C., Kapsa, J., Besland, M.P., Grenet, G., Marty, O., Pitaval, M., Hollinger, G.

Year:

2001

Language:

english

File:

PDF, 727 KB

english, 2001

34

How a dc Electric Field Drives Mott Insulators Out of Equilibrium

Diener, P., Janod, E., Corraze, B., Querré, M., Adda, C., Guilloux-Viry, M., Cordier, S., Camjayi, A., Rozenberg, M., Besland, M. P., Cario, L.

Journal:

Physical Review Letters

Year:

2018

Language:

english

File:

PDF, 1.28 MB

english, 2018

35

Deposition of AlN films by reactive sputtering: Effect of radiofrequency substrate bias

B. Abdallah, A. Chala, P.-Y. Jouan, M.P. Besland, M.A. Djouadi

Journal:

Thin Solid Films

Year:

2007

Language:

english

File:

PDF, 331 KB

english, 2007

36

[IEEE 2011 3rd IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2011.05.22-2011.05.25)] 2011 3rd IEEE International Memory Workshop (IMW) - Resistive Switching Driven by Electric Field in the Mott Insulators AM4X8 (A = Ga, Ge; M= V, Nb, Ta; X = S, Se): Towards a New Class of Non-Volatile RRAM Memory

Souchier, E., Vaju, C., Guiot, V., Corraze, B., Janod, E., Tranchant, J., Mazoyer, P., Besland, M.-P., Cario, L.

Year:

2011

Language:

english

File:

PDF, 992 KB

english, 2011

37

A Leaky-Integrate-and-Fire Neuron Analog Realized with a Mott Insulator

Stoliar, Pablo, Tranchant, Julien, Corraze, Benoit, Janod, Etienne, Besland, Marie-Paule, Tesler, Federico, Rozenberg, Marcelo, Cario, Laurent

Journal:

Advanced Functional Materials

Year:

2017

Language:

english

File:

PDF, 2.13 MB

english, 2017

38

Residual stress control in MoCr thin films deposited by ionized magnetron sputtering

J. Tranchant, B. Angleraud, P.Y. Tessier, M.P. Besland, J.P. Landesman, M.A. Djouadi

Journal:

Surface and Coatings Technology

Year:

2006

Language:

english

File:

PDF, 212 KB

english, 2006

39

Influence of Ion Bombardment and Annealing on the Structural and Optical Properties of TiOx Thin Films Deposited in Inductively Coupled TTIP/O2 Plasma

Agnes Granier, Thomas Begou, K. Makaoui, Akram Soussou, Bruno Bêche, Etienne Gaviot, Marie-Paule Besland, Antoine Goullet

Journal:

Plasma Processes and Polymers

Year:

2009

Language:

english

File:

PDF, 258 KB

english, 2009

40

Raman and XPS studies of CIGS/Mo interfaces under various annealing temperatures

Han, Junfeng, Ouyang, Liangqi, Zhuang, Daming, Liao, Cheng, Liu, Jiang, Zhao, Ming, Cha, Li-mei, Besland, M.-P.

Journal:

Materials Letters

Year:

2014

Language:

english

File:

PDF, 1.04 MB

english, 2014

41

Control of resistive switching in AM 4 Q 8 narrow gap Mott insulators: A first step towards neuromorphic applications

Tranchant, Julien, Janod, Etienne, Corraze, Benoît, Stoliar, Pablo, Rozenberg, Marcelo, Besland, Marie-Paule, Cario, Laurent

Journal:

physica status solidi (a)

Year:

2015

Language:

english

File:

PDF, 766 KB

english, 2015

42

Reactive ion etching of sol–gel-processed SnO2 transparent conducting oxide as a new material for organic light emitting diodes

D Vaufrey, M Ben Khalifa, M.P Besland, C Sandu, M.G Blanchin, V Teodorescu, J.A Roger, J Tardy

Journal:

Synthetic Metals

Year:

2002

Language:

english

File:

PDF, 214 KB

english, 2002

43

Impedance and electric modulus study of amorphous TiTaO thin films: highlight of the interphase effect

Rouahi, A, Kahouli, A, Challali, F, Besland, M P, Vallée, C, Yangui, B, Salimy, S, Goullet, A, Sylvestre, A

Journal:

Journal of Physics D Applied Physics

Year:

2013

Language:

english

File:

PDF, 537 KB

english, 2013

44

Comparison of Electrical Behavior of GaN-Based MOS Structures Obtained by Different PECVD Process

Al Alam, Elias, Cortés, Ignasi, Begou, T., Goullet, Antoine, Morancho, Frederique, Cazarré, Alain, Regreny, P., Brault, J., Cordier, Yvon, Besland, Marie Paule, Isoird, K.

Journal:

Materials Science Forum

Year:

2012

Language:

english

File:

PDF, 402 KB

english, 2012

45

Investigation of oxide layer on CdTe film surface and its effect on the device performance

Jun-feng, Han, Liu, Xiao, Li-mei, Cha, Hamon, Jonathan, Besland, M.P.

Journal:

Materials Science in Semiconductor Processing

Year:

2015

Language:

english

File:

PDF, 474 KB

english, 2015

46

First demonstration of “Leaky Integrate and Fire” artificial neuron behavior on (V0.95Cr0.05)2O3 thin film

Adda, Coline, Cario, Laurent, Tranchant, Julien, Janod, Etienne, Besland, Marie-Paule, Rozenberg, Marcelo, Stoliar, Pablo, Corraze, Benoit

Journal:

MRS Communications

Year:

2018

Language:

english

File:

PDF, 725 KB

english, 2018

47

Comparison of lanthanum substituted bismuth titanate (BLT) thin films deposited by sputtering and pulsed laser deposition

M.P. Besland, H. Djani-ait Aissa, P.R.J. Barroy, S. Lafane, P.Y. Tessier, B. Angleraud, M. Richard-Plouet, L. Brohan, M.A. Djouadi

Journal:

Thin Solid Films

Year:

2006

Language:

english

File:

PDF, 366 KB

english, 2006

48

Screen-printed carbon electrode modified on its surface with amorphous carbon nitride thin film: Electrochemical and morphological study

F. Ghamouss, P.-Y. Tessier, A. Djouadi, M.-P. Besland, M. Boujtita

Journal:

Electrochimica Acta

Year:

2007

Language:

english

File:

PDF, 1.15 MB

english, 2007

49

Metal–insulator transitions in (V1-xCrx)2O3 thin films deposited by reactive direct current magnetron co-sputtering

Querré, Madec, Janod, Etienne, Cario, Laurent, Tranchant, Julien, Corraze, Benoit, Bouquet, Valérie, Deputier, Stéphanie, Cordier, Stéphane, Guilloux-Viry, Maryline, Besland, Marie-Paule

Journal:

Thin Solid Films

Year:

2015

Language:

english

File:

PDF, 1.90 MB

english, 2015

50

Mott insulators: A large class of materials for Leaky Integrate and Fire (LIF) artificial neuron

Adda, Coline, Corraze, Benoit, Stoliar, Pablo, Diener, Pascale, Tranchant, Julien, Filatre-Furcate, Agathe, Fourmigué, Marc, Lorcy, Dominique, Besland, Marie-Paule, Janod, Etienne, Cario, Laurent

Journal:

Journal of Applied Physics

Year:

2018

Language:

english

File:

PDF, 3.45 MB

english, 2018

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